An experiment to investigate the survival time in hours of an electronic component consists of placing the parts in a test cell and running them for 100 hours under elevated temperature conditions. (This is called an “accelerated” life test.) Eight components were tested with the following resulting failure times:
75, 63, 100+, 36, 51, 45, 80, 90
The observation 100+ indicates that the unit still functioned at 100 hours. Is there any meaningful measure of location that can be calculated for these data? What is its numerical value?