# Question: Consider the chart in Exercise 6 55 Find the average run

Consider the chart in Exercise 6.55. Find the average run length for the chart.

**View Solution:**## Answer to relevant Questions

Control charts for and R are in use with the following parameters: The sample size is n = 9. Both charts exhibit control. The quality characteristic is normally distributed. (a) What is the a-risk associated with the ...(a) Thirty observations on the oxide thickness of individual silicon wafers are shown in table 6E.23. Use these data to set up a control chart on oxide thickness and a moving range chart. Does the process exhibit statistical ...The uniformity of a silicon wafer following an etching process is determined by measuring the layer thickness at several locations and expressing uniformity as the range of the thicknesses. Table 6E.29 presents uniformity ...The diameter of the casting in Figure 6.25 is also an important quality characteristic. A coordinate measuring machine is used to measure the diameter of each casting at five different locations. Data for 20 casting are ...Diodes used on printed circuit boards are produced in lots of size 1000. We wish to control the process producing these diodes by taking samples of size 64 from each lot. If the nominal value of the fraction nonconforming is ...Post your question