# Question

Control charts for have been maintained on a process and have exhibited statistical control. The sample size is n = 6. The control chart parameters are as follows:

(a) Estimate the mean and standard deviation of the process.

(b) Estimate the natural tolerance limits for the process.

(c) Assume that the process output is well modeled by a normal distribution. If specifications are 703 and 709, estimate the fraction nonconforming.

(d) Suppose the process mean shifts to 702.00 while the standard deviation remains constant. What is the probability of an out-of-control signal occurring on the first sample following the shift?

(e) For the shift in part (d), what is the probability of detecting the shift by at least the third subsequent sample?

(a) Estimate the mean and standard deviation of the process.

(b) Estimate the natural tolerance limits for the process.

(c) Assume that the process output is well modeled by a normal distribution. If specifications are 703 and 709, estimate the fraction nonconforming.

(d) Suppose the process mean shifts to 702.00 while the standard deviation remains constant. What is the probability of an out-of-control signal occurring on the first sample following the shift?

(e) For the shift in part (d), what is the probability of detecting the shift by at least the third subsequent sample?

## Answer to relevant Questions

Components used in a cellular telephone are manufactured with nominal dimension of 0.3 mm and lower and upper specification limits of 0.295 mm and 0.305 mm respectively. The x and R control charts for this process are based ...Thirty observations on concentration (in g/l) of the active ingredient in a liquid cleaner produced in a continuous chemical process are shown in Table 6E.26. (a) A normal probability plot of the concentration data is shown ...Reconsider the hardness measurements in Exercise 6.62. Construct an individuals control chart using the median of the span-two moving ranges to estimate variability. Compare this control chart to the one constructed in ...Consider the situation described in Exercise 6.80. A critical dimension (measured in m) is of interest to the process engineer. Suppose that five fixed positions are used on each wafer (position 1 is the center) and that ...Do points that plot below the lower control limit on a fraction nonconforming control chart (assuming that the LCL > 0) always mean that there has been an improvement in process quality? Discuss your answer in the context of ...Post your question

0