A semiconductor manufacturer collects data from a new tool and conducts a hypothesis test with the null
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A semiconductor manufacturer collects data from a new tool and conducts a hypothesis test with the null hypothesis that a critical dimension mean width equals 100 nm. The conclusion is to not reject the null hypothesis. Does this result provide strong evidence that the critical dimension mean equals 100 nm? Explain.
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Related Book For
Applied Statistics And Probability For Engineers
ISBN: 9781118539712
6th Edition
Authors: Douglas C. Montgomery, George C. Runger
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