In an accelerated failure test, components are operated under extreme conditions so that a substantial number will fail in a rather short time. In such a test involving two types of microchips, 600 chips manufactured by an existing process were tested, and 125 of them failed. Then 800 chips manufactured by a new process were tested, and 130 of them failed. Find a \(90 \%\) confidence interval for the difference between the proportions of failures for chips manufactured by the two processes.