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Long Term Reliability Of Nanometer Vlsi Systems Modeling Analysis And Optimization(1st Edition)
Authors:
Sheldon Tan ,Mehdi Tahoori ,Taeyoung Kim ,Shengcheng Wang ,Zeyu Sun ,Saman Kiamehr
Cover Type:Hardcover
Condition:Used
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Book details
ISBN: 3030261743, 978-3030261740
Book publisher: Springer
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