The relative conductivity of a semiconductor device is determined by the amount of impurity "doped" into the device during its manufacture. A silicon diode to be used for a specific purpose requires an average cut-on voltage of .60 V, and if this is not achieved, the amount of impurity must be adjusted. A sample of diodes was selected and the cut-on voltage was determined. The accompanying SAS output resulted from a request to test the appropriate hypotheses.

[SAS explicitly tests H0: μ = 0, so to test H0: μ = .60, the null value .60 must be subtracted from each xi; the reported mean is then the average of the (xi - .60) values. Also, SAS's P-value is always for a two-tailed test.] What would be concluded for a significance level of .01? .05? .10?

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Mean Std Dev T Prob. > T 15 0.0453333 0.0899100 1.9527887 0.0711