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The time to failure in hours of an electronic component

The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 4E.1. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across).

a. Calculate the sample average and standard deviation.

b. Construct a histogram.

c. Construct a stem-and-leaf plot.

d. Find the sample median and lower and upper quartiles.

a. Calculate the sample average and standard deviation.

b. Construct a histogram.

c. Construct a stem-and-leaf plot.

d. Find the sample median and lower and upper quartiles.

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