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Due to the poor quality of various semiconductor products used in their manufacturing process, Microlaboratories has decided to develop a QC program. Because the semiconductor parts they get from suppliers are either good or defective, Milton Fisher has decided to develop control charts for attributes.

The total number of semiconductors in every sample is 200. Furthermore, Milton would like to determine the upper control chart limit and the lower control chart limit for various values of the fraction defective (p) in the sample taken. To allow more flexibility, he has decided to develop a table that lists values for p, UCL, and LCL. The values for p should range from 0.01 to 0.10, incrementing by 0.01 each time. What are the UCLs and the LCLs for 99.7% confidence?

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