Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding (IEICE EEI Transactions on Information & Systems, Jan. 2005). The new method is designed to reduce the time required for input decompression and output compression-called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits (all of different sizes) from a SUN Blade 1000 workstation. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method, and the compression ratio was recorded. The data are given in the accompanying table. Compare the two methods with a 95% confidence interval. Which method has the smaller mean compression ratio?

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CircuitStandard Method Huffman-coding Method .80 .80 .83 .53 .50 ,96 .99 .98 .81 .95 .99 .78 .80 .86 .53 51 .68 .82 .72 .45 :79 10