The thickness of silicon wafers is an important characteristic in microelectronic circuits. The upper specification limit for the thickness is 0.015 mm. It is estimated that the standard deviation of the thickness of wafers is 0.0014 mm. We wish to accept lots that are 11 % nonconforming with a probability of 5%. For lots that are 2% nonconforming, it is desired that the probability of rejection not exceed 4%. Find the parameters of a variable sampling plan, assuming the first of the two conditions is to be satisfied exactly. A random sample of 17 wafers yielded an average of 0.013 mm. Describe the decision regarding the lot based on Forms 1 and 2.