Refer to Problem 4.6. The wafers are also classified by thickness of silicon coating (z = 0, low; z = 1, high). The first five imperfection counts reported for each treatment refer to z = 0 and the last five refer to z = 1. Analyze these data.

Data from Prob. 4.6:

An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4.

Treatment B applied to 10 other wafers has 9,9,8, 14,8, 13, 11,5, 7,6 imperfections. Treat the counts as independent poisson variates having means µ_A and µ_B.