An article in the Journal of Electronic Material [“Progress in CdZnTe Substrate Producibility and Critical Drive of IRFPA Yield Originating with CdZnTe Substrates” (1998, Vol. 27(6), pp. 564–572)] improved the quality of CdZnTe substrates used to produce the HgCdTe infrared focal plane arrays (IRFPAs) also defined as sensor chip assemblies (SCAs). The cut-on wavelength (μ) on 11 wafers was measured and follows:

6.06 6.16 6.57 6.67 6.98 6.17 6.17 6.93 6.73 6.87 6.76

(a) Is there evidence that the mean of cut-on wavelength is not 6.50 μm?

(b) What is the P-value for this test?

(c) What sample size would be required to detect a true mean cut-on wavelength of 6.25 μm with probability 95%?

(d) What is the type II error probability if the true mean cut-on wavelength is 6.95 μm?