# An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For

## Question:

An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means and B.

**a.** Fit the model log = a + x, where x = 1 for treatment B and x = 0 for treatment A. Show that = log Blog A, and interpret its estimate.

**b.** Test HoA = B by conducting the Wald or likelihood-ratio test of Ho = 0. Interpret.

**c.** Construct a 95% confidence interval for B/A. (Hint: First construct one for Blog Blog = log(/A)).

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