Question: 1. A semiconductor manufacturer collected data from a new tool and conducted a hypothesis test with the null hypothesis being a critical dimension mean width
1. A semiconductor manufacturer collected data from a new tool and conducted a hypothesis test with the null hypothesis being a critical dimension mean width equals 100 nm. After the test was carried out, the conclusion was to reject the null hypothesis. Does the test provide strong evidence that the critical dimension mean width equals 100 nm? Explain your answer
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