(20 pts) Name the most appropriate control chart for each of the situations described below: It is desired to quickly detect a small shift in the number of defective units coming from an automated, 100% inspected process. a. b. It is desired to rapidly find a large shift in the frequency of minor defects present on a l square foot sample of silicon photocell arrays - while producing many different sizes of arrays. It is desired to quickly detect a large shift in the mean size of axle shafts, taken in samples of 5. d. It is desired to detect a large shift in the number of defective integrated circuits found in a constant sample size of 50 circuit packages. e. It is desired to detect a large shift in the number of non-conforming bearing diameters exiting an automated inspection station that checks each produced part. f. It is desired to detect a large change in the variation of the axle size diameter by taking frequent samples of size 15. &. It is desired to track the fraction of defective integrated circuits in a sample that may change in size with current production orders. h. It is desired to catch a slow increase in the number of scratches found on our solar cells by inspecting each cell as it is made. Scratches do not ruin the cell, but do lower the voltage output. i. It is desired to detect a change in the spread of diameters from a bearing-making process by taking frequent samples of size 6 units every 10 minutes. It is desired to track the number of defects present on the painted surface of microwave oven cases exiting the paint department