4-6 Chip testing Professor Diogenes has n supposedly identical integrated-circuit chips that in principle are capable of testing each other. The professor's test jig accommodates two chips at a time. When the jig is loaded, each chip tests the other and reports whether it is good or bad. A good chip always reports accurately whether the other chip is good or bad, but the professor cannot trust the answer of a bad chip. Thus, the four possible outcomes of a test are as follows: b. Show that n/2 pairwise tests are sufficient to reduce the problem to one of nearly half the size. That is, show how to use n/2 pairwise tests to obtain a set with at most n/2 chips that still has the property that more than half of the chips are good. c. Show how to apply the solution to part (b) recursively to identify one good chip. Give and solve the recurrence that describes the number of tests needed to identify one good chip