$5)$ What microscopy instrument $($optical$,$ SEM, TEM, AFM, or STM$)$ would you use to characterize the following materials $($and why$)?$

a$)$ Measure the lattice distortion within Cu nanoparticles due to the substitution of Rh into the Cu structure.

b$)$ Measure the size and shape of asbestos particles in ceiling insulation

c$)$ Measure the thickness of the SiO$2$ thin film on a Si wafer.

d$)$ Characterize the crack defect within a steel support rod that was sitting within seawater for $1$ year.

e$)$ Measure roughness and morphology of a UV coating on a glass window $($to check manufacturer$$s stated smoothness, ranging between $0\mathrm{.}2-1$m$).$