{ a INSTRUCTIONS COMPONENTS TO ANSWER: Answer all questions. SUBMISSION: Submission via the Turnitin links on Blackboard. Word-processed documents with figures from professional software are required. 1 Q1 (a) Show that X-ray diffraction from a X-ray source of wavelength, modelled as reflection between two bki planes separated by a distance dai gives rise to the Bragg Equation (Egn.1) 2dansinni = (n = 1,2,3..> En 1 (2 marks) (6) Using schematic diagram(s), show how the Bragg-Brentano diffractometer, measures the diffraction angle, 20, during a PXRD experiment. Explain how changes in the divergence slit (at the source) and receiver slit (at the detector) might affect (0) peak intensity and (ll) peak resolution in the PXRD pattern. (4 marks) (c) State the possible Bravais lattices for centred cubic systems and briefly explain how General Systematic Absences in the X-ray diffraction data arise when lattice centring is present and how this can be identified when indexing a cubic system. (6 marks) (d) In an experiment to prepare nanodiamonds on a niobium metal substrate with chemical vapour deposition, the diffraction pattern shown below was obtained from a sample using Cu-Ka radiation (7. = 1.542 A). Peak informalin is given in the table below III o