Compositional analysis by means of scanning electron microscopy with X - ray energy dispersive mode (SEM-EDX) is considered as a qualitative analysis. (i) Describe briefly on how the X - ray is generated, detected and analysed in SEM-EDX. (ii) Explain, with diagram, THREE type of artefacts or false X-ray signal that commonly occurred in SEM-EDX analysis. (iii) Describe clearly why electron probe microanalysis (EPMA) is considered a more quantitative analysis technique compared to SEM-EDX