The below table provides the wafer measurements for 25 samples. a. Construct appropriate control charts with details
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Question:
The below table provides the wafer measurements for 25 samples.
a. Construct appropriate control charts with details calculations and conclusion?
b. If the wafer specifications are 1.50+/-0.5 microns, what percentage of product will be nonconforming products?
c. Based on Process Capability Measure, what will be your conclusions?
d. What is the probability of detecting a shift to µ1=µ0+2?
Related Book For
Introduction to Statistical Quality Control
ISBN: 978-1118146811
7th edition
Authors: Douglas C Montgomery
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