Course: High Performance Computer Architecture $**$Question: Given a $64-$bit processor with a die size of $2\mathrm{.}4$ cm$^2$ and manufactured from a $42$ cm$-$diameter wafer that costs $9,000,$ determine the expected cost per die before testing. Assume a wafer yield of $99\%,$ and utilize the defect model from the book, with $0\mathrm{.}016$ defects per cm$^2$ and N$=-10.$ Disregard edge effect correction.