Question: Die yield = Wafer yield x 1/(1 + Defects per unit area x Die area) N Chip Die Size (mm 2) Estimated defect rate (per
Die yield = Wafer yield x 1/(1 + Defects per unit area x Die area) N
| Chip | Die Size (mm2) | Estimated defect rate (per cm2) | N | Manufacturing size (nm) | Transistors (billion) | Cores |
| BlueDragon | 180 | 0.03 | 12 | 10 | 7.5 | 4 |
| RedDragon | 120 | 0.04 | 14 | 7 | 7.5 | 4 |
| Phoenix | 200 | 0.04 | 14 | 7 | 12 | 8 |
Figure 1.26
Please use the die yield formula with the N values provided in Figure 1.26 to answer the questions below:
a. What is the yield for the Phoenix chip?
b. Why does Phoenix have a higher defect rate than BlueDragon?
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