Question: Die yield = Wafer yield x 1/(1 + Defects per unit area x Die area) N Chip Die Size (mm 2) Estimated defect rate (per

Die yield = Wafer yield x 1/(1 + Defects per unit area x Die area) N

Chip

Die Size

(mm2)

Estimated defect rate

(per cm2)

N

Manufacturing size (nm)

Transistors

(billion)

Cores

BlueDragon

180

0.03

12

10

7.5

4

RedDragon

120

0.04

14

7

7.5

4

Phoenix

200

0.04

14

7

12

8

Figure 1.26

Please use the die yield formula with the N values provided in Figure 1.26 to answer the questions below:

a. What is the yield for the Phoenix chip?

b. Why does Phoenix have a higher defect rate than BlueDragon?

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