Question: During X-ray microanalysis for samples with multi-elemental composition, identification of elements with a concentration <5 wt% is difficult due to weak, noisy and overlapped peaks.
During X-ray microanalysis for samples with multi-elemental composition, identification of elements with a concentration <5 wt% is difficult due to weak, noisy and overlapped peaks. suggest THREE solutions to enhance the visibility and clarity of such peaks
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