(e) Scan path tests are commonly used in logic testing. A typical digital circuit is represented as in Figure 3.2. (i) Manually insert the scan path logic into the circuit. (4 marks) (ii) Explain how the scan path works (2 marks) 0 2 0Combinational Logic D Q Figure 3.2 (e) Scan path tests are commonly used in logic testing. A typical digital circuit is represented as in Figure 3.2. (i) Manually insert the scan path logic into the circuit. (4 marks) (ii) Explain how the scan path works (2 marks) 0 2 0Combinational Logic D Q Figure 3.2