(E). The equivalent capacitance circuit with interface traps is given in Fig. 2 where Cit is the capacitance due to interface states, C; and Ca are oxide capacitance and depletion capacitance, respectively. Using this, describe the difference between capacitance (marked in X) for low and high frequency measurement. C Ci Cd Figure 2.2: Figure for Q2E (F). Show that: C; CLF Ci CHF Cit = (2.1) Ci- CLF Ci-CHF where CLF and CHF are the device capacitance measured at low frequency and high frequency, respectively. Hint: Use the equivalent circuit of Q2E, write equations for CLE and CHF and try to remove Ca from these equa- tions