Question: For each of the surface characterization techniques listed below, please describe the physical principle the technique is based on, list the depth of analysis and

For each of the surface characterization techniques listed below, please describe the physical principle the technique is based on, list the depth of analysis and analytical sensitivity (these values can be ranges). Use the Wagner 2020 textbook or the Grainger and Caster chapter on bcourses to supplement information given in class. (5 pts each, 15 pts total) a) Contact angle b) X-ray Photoelectron Spectroscopy (XPS) c) Quartz Crystal Microbalance (QCM)

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