Question: If we were to order the microscopy techniques commonly used in nanotechnology for flexibility (many modes), broad range of applicability (dimensions and type of samples),
If we were to order the microscopy techniques commonly used in nanotechnology for flexibility (many modes), broad range of applicability (dimensions and type of samples), and ease of use (sample preparation and operational), what would be a reasonable order? Scanning electron microscope (SEM) Optical microscope Tunneling electron microscope (TEM) Atomic force microscope (AFM) Scanning tunneling microscope (STM)
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