Question: In a particular semiconductor device an oxide layers forms a barrier 0 . 6 nm wide and 9 . 0 0 V high between two

In a particular semiconductor device an oxide layers forms a barrier 0.6nm wide and 9.00 V high between two conducting wires. Electrons accelerates through 4.00V approach the barrier. a) What fraction of the incident electrons will tunnel through the barrier? b) Through what potential differenece should the elctrons be accelerated in order to increase the tunneling fraction by a factor of 2?

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