Question: Problem #1: (3-D Charts) In this problem, wafer is processed one at a time by a machine.(They are not processed in a group or lot.)

Problem #1: (3-D Charts) In this problem, wafer is processed one at a time by a machine.(They are not processed in a group or lot.) Within-piece variability is important and is to be tracked by a within-piece range chart. In addition, the process mean is to be monitored with an individual X chart and piece-to-piece variability is to be monitored with a moving range , chart, with a moving window size of 2.

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