Problem $1$:

Suppose the fraction defective is $0\mathrm{.}05,$ find the ASN for double

sampling plan defined by $(n_1=50,c_1=1,n_2=50,c_2=2),$ in case of

curtailment at the second sample

Problem $2$:

A single sample plan has $n=50$; find $c$ that will result in least ATI and

AOQL$0\mathrm{.}01$

Problem $3$:

Consider a double sampling plan with $n_1=50,c_1=1,c_2=2.$ Find the

smallest $n_2$ that will result in AQL$=0\mathrm{.}01$ with $0\mathrm{.}05,$ and $RQL=0\mathrm{.}1$

with $0\mathrm{.}2.$