Question $28(2$ points$)$

What do the process potential index $($ Cp $)$ and the measurement capability index $($ Cm $)$

have in common?

Both yield the same result.

Both are calculated using the formula $($USL $-$ LSL$)/(6).$

Both are used to measure the entire process.

Both Cp and Cm have a desired index of $1\mathrm{.}33$ or better.