Go back

Atomic Scale Characterization And First Principles Studies Of Si N Interfaces(2011th Edition)

Authors:

Weronika Walkosz

Free atomic scale characterization and first principles studies of si n interfaces 2011th edition weronika walkosz
5 ratings
Cover Type:Hardcover
Condition:Used

In Stock

Include with your book

Free shipping: April 04, 2024
Access to 3 Million+ solutions Free
Ask 10 Questions from expert 200,000+ Expert answers
7 days-trial

Total Price:

$0

List Price: $108.11 Savings: $108.11(100%)

Book details

ISBN: 1461428572, 978-1461428572

Book publisher: Springer