Design For Testability Debug And Reliability Next Generation Measures Using Formal Techniques(1st Edition)
Authors:
Sebastian Huhn ,Rolf Drechsler
Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New
In Stock: 2 Left
Shipment time
Expected shipping within 2 - 3 DaysPopular items with books
Access to 35 Million+ Textbooks solutions
Free ✝
Ask Unlimited Questions from expert
AI-Powered Answers
30 Min Free Tutoring Session
✝ 7 days-trial
Total Price:
$56.11
List Price: $80.16
Savings: $24.05
(30%)
Solution Manual Includes
Access to 30 Million+ solutions
Ask 50 Questions from expert
AI-Powered Answers
24/7 Tutor Help
Detailed solutions for Design For Testability Debug And Reliability Next Generation Measures Using Formal Techniques
Price:
$9.99
/month
Book details
ISBN: 3030692116, 978-3030692117
Book publisher: Springer





























