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Long Term Reliability Of Nanometer Vlsi Systems Modeling Analysis And Optimization(1st Edition)

Authors:

Sheldon Tan ,Mehdi Tahoori ,Taeyoung Kim ,Shengcheng Wang ,Zeyu Sun ,Saman Kiamehr

Free long term reliability of nanometer vlsi systems modeling analysis and optimization 1st edition sheldon tan
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Cover Type:Hardcover
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Book details

ISBN: 3030261743, 978-3030261740

Book publisher: Springer