Software Trace And Log Analysis A Pattern Reference(1st Edition)

Authors:

Dmitry Vostokov ,Software Diagnostics Institute

Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New

In Stock: 1 Left

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Book details

ISBN: 1908043806, 978-1908043801

Book publisher: Opentask

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Book Price $0 : General Trace And Log Analysis Patterns Allow Application Of Uniform Problem Detection And Solving Approach Across Diverse Software Environments. This Pattern Language Covers Any Execution Artifact From A Small Debugging Trace To A Distributed Log With Billions Of Messages From Hundreds Of Computers, Thousands Of Software Components, Threads, And Processes. Pattern-oriented Trace And Log Analysis Is Applicable To Troubleshooting And Debugging Windows, Mac OS X, Linux, FreeBSD, Android, IOS, Z/OS, And Any Other Possible Computer Platform. Its Pattern Catalog Is A Part Of Pattern-oriented Software Diagnostics, Forensics, And Prognostics Developed By Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This Reference Reprints With Corrections 100 Patterns Originally Published In Memory Dump Analysis Anthology Volumes 3 - 8a And Software Diagnostics Library (former Crash Dump Analysis Blog, DumpAnalysis.org/blog). Full-color Diagrams Accompany Most Pattern Descriptions.