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Testability Concepts For Digital ICs The Macro Test Approach(1st Edition)

Authors:

F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen

Free testability concepts for digital ics the macro test approach 1st edition f.p.m. beenker, r.g. bennetts, a.p.
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Book details

ISBN: 0792396588, 978-0792396581

Book publisher: Springer