Data on oxide thickness of semiconductors are as follows: 425, 431, 416, 419, 421, 436, 418, 410, 431, 433, 423, 426, 410, 435, 436, 428, 411, 426, 409, 437, 422, 428, 413, 416.
(a) Calculate a point estimate of the mean oxide thickness for all wafers in the population.
(b) Calculate a point estimate of the standard deviation of oxide thickness for all wafers in the population.
(c) Calculate the standard error of the point estimate from part (a).
(d) Calculate a point estimate of the median oxide thickness for all wafers in the population.
(e) Calculate a point estimate of the proportion of wafers in the population that have oxide thickness greater than 430 angstrom.