Problem 12.21 The following data give the polysilicon resistivities measured at three dif[1]ferent positions for each of six randomly selected silicon wafers. Wafer 1 Wafer 2 Wafer 3 Wafer 4 Wafer 5 Wafer 6 Resistivity 47.337 56.053 44.594 44.430 47.093 46.825 Resistivity 46.815 55.640 42.759 47.790 47.529 47.239 Resistivity 46.221 56.126 43.670 46.313 48.056 47.830

(a) Construct the ANOVA table and test the hypothesis that there is no significant difference in the resistivities among the silicon wafers; use α = 0.05.

(b) Estimate the components of variance.