4) Choose the correct expression: a) Decreasing the operating voltage of a TEM does not affect the resolution. b) Every TEM has a certain resolution power that cannot be improved if correctly used. c) If we cannot see the grains in a sample this may be due to low resolution of that TEM d) We should only be concerned about the resolution at the objective lens but not about the lenses located after the objective lens of TEM. 5) Choose the correct expression: a) If the region under examination in a TEM sample is in Bragg condition, there is no inelastic interaction events in this region. b) Diffraction spots can get dimmer as the sample is moved out of Bragg condition with respect to the electron beam direction. c) When characterizing materials using TEM, all diffraction patterns we can create are different in terms of the symmetry they show if taken from different phases. d) We can use the illumination due to inelastic scattering events when imaging for characterization purposes.