9. Figure below shows an X-ray diffraction pattern for Copper taken using a diffractometer and monochromatic X-radiation having a wavelength of 0.154 nm; each diffraction peak on the pattern has been indexed. Compute the interplanar spacing for planes (111), (200) indexed; also determine the lattice parameter for those two peaks. (12 pts) (200) Relative intensity (a.u.) (111) (220) (a) - 10 20 30 40 50 60 70 80 200