A process engineer has defined the control limits for this process as three standard deviations above and below the mean, meaning that if a lot of measurements suddenly appear outside these limits$,$ the process is out of control. Ideally, these control limits are within the product specification limits$.$ For this product, the specification limits are $0\mathrm{.}260m$ and $0\mathrm{.}340m.$ If a width does not fall between these values, the chip fails testing and is destroyed. What are the control limits for this process?

$\stackrel{}{x}-3s_x=$

$\stackrel{}{x}+3s_x=$