A production process for the JMF Semicon is monitored using x-bar and R charts. 10 samples of n=15 observations have been gathered with the following results: Sample Mean Range 251 29 258 45 233 36 275 25 234 35 289 20 256 3 265 19 246 14 323 46 1 2 3 4 5 6 7 8 9 10 Calculate the center line (CL), upper control limit (UCL), and lower control limit (LCL) for x-bar and R charts, and then draw the conclusion about whether the process is in control or not. The charts are not required. For the calculations, please show the steps instead of only giving the final results.

A production process for the JMF Semicon is monitored using x-bar and R charts. 10 samples of n=15 observations have been gathered with the following results: Calculate the center line (CL), upper control limit (UCL), and lower control limit ( LCL ) for x-bar and R charts, and then draw the conclusion about whether the process is in control or not. The charts are not required. For the calculations, please show the steps instead of only giving the final results. A production process for the JMF Semicon is monitored using x-bar and R charts. 10 samples of n=15 observations have been gathered with the following results: Calculate the center r line (CL), upper control limit (UCL), and lower control limit (LCL) for x-bar and R charts, and then draw the conclusion about whether the process is in control or not. The charts are not required. For the calculations, please show the steps instead of only giving the final results. You could also use the template below and submit the finished Excel file