A student is calibrating a thin film deposition system with interference by shining a 6 3 3
Question:
A student is calibrating a thin film deposition system with interference by shining a nm laser on a film and measuring the reflection. So that the incident and reflected beams do not overlap, the laser is held at a slight angle but the angle can be ignored in the questions below The systems makes a thin film of cryolite n on a sapphire n substrate. For questions and below, make sure to show your work by drawing a diagram of the incident and reflected rays and by calculating the phase difference.
Based on the deposition settings, the film made should be between and nm thick to produce maximal reflections. What is the film's precise thickness?
A different film is made with a thickness between nm and nm with other settings. This film has zero reflection. What is the film's precise thickness?
Finally, a third film is made that is between nm and nm thick. The reflected light has half of the amplitude of the constructive reflection in question # What is this film's precise thickness?
Fundamentals Of Momentum Heat And Mass Transfer
ISBN: 9781118947463
6th Edition
Authors: James Welty, Gregory L. Rorrer, David G. Foster