Althea Electronics bullds radlation$-$hardened computer chips for the military and for NASA. These chips

are extremely difficult to fabricate and have much higher defect rates than other comparable computer

chips. Althea produces these chips in batches of $100.$ It tested the last $15$ batches of chips and

determined the number of defective chips in each batch. The data are listed below.

Compute the upper control limit $($UCL$)$ and the lower control limit $($LCL$)$ for the percentage defective.

Enter answers in questions below as percent rounded to nearest $1$ decimal $(xx.x)$

Question $16$

Althea Electronics:

UCL$=$

Question $17$

Althea Electronics:

$LCL=$

$0$

Question $18$

Using these established control limits$,$ would Althea's next batch with $10$ defects be out of control?

No because it's less than the UCL

Yes because it's less than the UCL

No because it's more than the UCL

Yes because it's more than the UCL

Question $19$

A resistor utilized in a critical electronic component is required to have a resistance of $50+-5.$ The

current manufacturer of this resistor has found that its manufacturing process produces a mean value of

$49\mathrm{.}8$ and has a standard deviation of $\mathrm{.}09.$

What is the $C_{pk}$ of this process? $($round to nearest $2$ decimals$)$

Question $20$

The specifications for a plastic liner call for a thickness of $3\mathrm{.}0\frac{+}{-}0\mathrm{.}1mm.$ The mean of the process is

$3\mathrm{.}02$ mm with a standard deviation of $0\mathrm{.}02$ mm $.$ What is the $C_{ph}$ for this process? $($round to $2$ decimals$)$