An automated microscope scanner is set up to visually inspect wafers for defects. The scanner spots and lists all defects in its field of vision that are larger than y microns in size. After examin$-$ ing n wafers, an attached computer records and lists every defect observed, along with the defect size. However, all defects on the wafers that are less than y microns in size are neither observed nor recorded. This is a situation of

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