Question: The tip of an atomic force microscope ( AFM ) is subjected to the forces shown ( if you are curious, see the description in

The tip of an atomic force microscope (AFM) is subjected to the forces shown
(if you are curious, see the description in Prob. 4.5 on p.215 of what an AFM is
used for). Use a vector approach to determine
(a) an equivalent force system at point B,
(b) an equivalent force system at point O.
The tip of an atomic force microscope ( AFM ) is

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