Two different wafer fabrication processes are being considered. The carbon content (in parts per million) of silicon wafers manufactured using both fab processes was measured. 14 wafers from process 1 had an average carbon content of 1.13 ppm. 12 wafers from process 2 had an average carbon content of 1.18 ppm From past history the carbon content from both processes is known to be normally distributed and the standard deviation of process 1 is 0.05 ppm while the standard deviation of process 2 is 0.06 ppm. Are there significant differences between the 2 processes in terms of mean carbon content? Evaluate using a 95% CI Evaluate using a hypothesis test at = 0.05