Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding. (IEICE Transactions
Question:
Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding. (IEICE Transactions on Information & Systems, Jan. 2005.) The new method is designed to reduce the time required for input decompression and output compression—called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits (all of different sizes) from a SUN Blade 1000 workstation. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method, and the compression ratio was recorded. The data are given in the next table. Compare the two methods with a 95% confidence interval. Which method has the smaller mean compression ratio?
Step by Step Answer:
Statistics For Engineering And The Sciences
ISBN: 9781498728850
6th Edition
Authors: William M. Mendenhall, Terry L. Sincich