Question: Consider the circuit shown in Fig. 8.2. Generate a test pattern for a stuck-at-0 fault at signal h! a 0 10/1 b 0 & h

Consider the circuit shown in Fig. 8.2. Generate a test pattern for a stuck-at-0 fault at signal h!a 0 10/1 b 0 & h 1/0 1 & i 1/0

a 0 10/1 b 0 & h 1/0 1 & i 1/0 1 g d e 1 Fig. 8.2 Test pattern at the gate level

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